Non-experts or experts? Statistical analyses of MOS using DSIS method

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• dc.contributor.author Sugito, Yasuko
• dc.contributor.author Bertalmío, Marcelo
• dc.date.accessioned 2020-10-19T07:28:50Z
• dc.date.issued 2020
• dc.description Comunicació presentada a: 2020 IEEE International Conference on Acoustics, Speech, and Signal Processing (ICASSP), celebrada a Barcelona (Espanya) del 4 a 8 de maig de 2020.
• dc.description.abstract In image quality assessments, the results of subjective evaluation experiments that use the double-stimulus impairment scale (DSIS) method are often expressed in terms of the mean opinion score (MOS), which is the average score of all subjects for each test condition. Some MOS values are used to derive image quality criteria, and it has been assumed that it is preferable to perform tests with non-expert subjects rather than with experts. In this study, we analyze the results of several subjective evaluation experiments using the DSIS method. Our first contribution is to discuss the statistical meaning of the MOS values, which has not been previously addressed in the literature. Second, our results show that, contrary to the established belief, there are advantages when performing subjective tests with experts, in that they allow experiments to be performed with fewer subjects, and to better determine the lower threshold of image quality.
• dc.description.sponsorship This work received partial funding from the European Union’s Horizon 2020 research and innovation programme under grant agreement number 761544 (project HDR4EU) and under grant agreement number 780470 (project SAUCE) and from the Spanish government and FEDER Fund, grant ref. PGC2018-099651-B-I00 (MCIU/AEI/FEDER, UE).
• dc.format.mimetype application/pdf
• dc.identifier.citation Sugito Y, Bertalmío M. Non-experts or experts? Statistical analyses of MOS using DSIS method. In: 2020 IEEE International Conference on Acoustics, Speech, and Signal Processing (ICASSP); 2020 May 4-8; Barcelona, Spain. New Jersery: The Institute of Electrical and Electronics Engineers; 2020. p. 2732-36. DOI: 10.1109/ICASSP40776.2020.9052906
• dc.identifier.doi http://dx.doi.org/10.1109/ICASSP40776.2020.9052906
• dc.identifier.issn 2379-190X
• dc.identifier.uri http://hdl.handle.net/10230/45507
• dc.language.iso eng
• dc.publisher Institute of Electrical and Electronics Engineers (IEEE)
• dc.relation.ispartof 2020 IEEE International Conference on Acoustics, Speech, and Signal Processing (ICASSP); 2020 May 4-8; Barcelona, Spain. New Jersery: The Institute of Electrical and Electronics Engineers; 2020. p. 2732-36
• dc.relation.projectID info:eu-repo/grantAgreement/EC/H2020/761544
• dc.relation.projectID info:eu-repo/grantAgreement/EC/H2020/780470
• dc.relation.projectID info:eu-repo/grantAgreement/ES/1PE/PGC2018-099651-B-I00
• dc.rights © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. http://dx.doi.org/10.1109/ICASSP40776.2020.9052906
• dc.rights.accessRights info:eu-repo/semantics/openAccess
• dc.subject.keyword The double-stimulus impairment scale (DSIS) methoden
• dc.subject.keyword Mean opinion score (MOS)en
• dc.subject.keyword Non-experten
• dc.subject.keyword Experten
• dc.subject.keyword Statistical analysisen
• dc.title Non-experts or experts? Statistical analyses of MOS using DSIS methoden
• dc.type info:eu-repo/semantics/conferenceObject
• dc.type.version info:eu-repo/semantics/acceptedVersion