Mismatched binary hypothesis testing: error exponent sensitivity

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• dc.contributor.author Boroumand, Parham
• dc.contributor.author Guillén i Fábregas, A. (Albert)
• dc.date.accessioned 2023-02-01T14:09:43Z
• dc.date.available 2023-02-01T14:09:43Z
• dc.date.issued 2022
• dc.description.abstract We study the problem of mismatched binary hypothesis testing between i.i.d. distributions. We analyze the tradeoff between the pairwise error probability exponents when the actual distributions generating the observation are different from the distributions used in the likelihood ratio test, sequential probability ratio test, and Hoeffding’s generalized likelihood ratio test in the composite setting. When the real distributions are within a small divergence ball of the test distributions, we find the deviation of the worst-case error exponent of each test with respect to the matched error exponent. In addition, we consider the case where an adversary tampers with the observation, again within a divergence ball of the observation type. We show that the tests are more sensitive to distribution mismatch than to adversarial observation tampering.
• dc.description.sponsorship This work was supported in part by the European Research Council under Grant 725411 and in part by the Spanish Ministry of Economy and Competitiveness under Grant PID2020-116683GB-C22.
• dc.format.mimetype application/pdf
• dc.identifier.citation Boroumand P, Guillén i Fàbregas A. Mismatched binary hypothesis testing: error exponent sensitivity. IEEE Trans Inf Theory. 2022;68(10):6738-61. DOI: 10.1109/TIT.2022.3171438
• dc.identifier.doi http://dx.doi.org/10.1109/TIT.2022.3171438
• dc.identifier.issn 0018-9448
• dc.identifier.uri http://hdl.handle.net/10230/55587
• dc.language.iso eng
• dc.publisher Institute of Electrical and Electronics Engineers (IEEE)
• dc.relation.ispartof IEEE Transactions on Information Theory. 2022;68(10):6738-61.
• dc.relation.projectID info:eu-repo/grantAgreement/EC/H2020/725411
• dc.relation.projectID info:eu-repo/grantAgreement/ES/2PE/PID2020-116683GB-C22
• dc.rights © 2022 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. http://dx.doi.org/10.1109/TIT.2022.3171438
• dc.rights.accessRights info:eu-repo/semantics/openAccess
• dc.subject.keyword Hypothesis testing
• dc.subject.keyword Mismatch
• dc.subject.keyword Likelihood ratio test
• dc.subject.keyword Generalized likelihood ratio test
• dc.subject.keyword Sequenstial probability ratio test
• dc.title Mismatched binary hypothesis testing: error exponent sensitivity
• dc.type info:eu-repo/semantics/article
• dc.type.version info:eu-repo/semantics/acceptedVersion