Bayesian M-Ary hypothesis testing: the meta-converse and Verdú-Han bounds are tight

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• dc.contributor.author Vazquez-Vilar, Gonzalo
• dc.contributor.author Tauste Campo, Adrià, 1982-
• dc.contributor.author Guillén i Fábregas, A. (Albert)
• dc.contributor.author Martínez, Alfonso, 1973-
• dc.date.accessioned 2018-12-05T14:31:31Z
• dc.date.available 2018-12-05T14:31:31Z
• dc.date.issued 2016
• dc.description.abstract Two alternative exact characterizations of the minimum error probability of Bayesian M-ary hypothesis testing are derived. The first expression corresponds to the error probability of an induced binary hypothesis test and implies the tightness of the meta-converse bound by Polyanskiy et al.; the second expression is a function of an information-spectrum measure and implies the tightness of a generalized Verdú-Han lower bound. The formulas characterize the minimum error probability of several problems in information theory and help to identify the steps where existing converse bounds are loose.en
• dc.description.sponsorship This work was supported in part by the European Research Council under Grant 259663, in part by the Spanish Ministry of Economy and Competitiveness under Grant FPDI-2013-18602, Grant RYC-2011-08150, and Grant TEC2012-38800-C03-03, and in part by the European Union’s 7th Framework Programme under Grant 303633 and Grant 329837.
• dc.format.mimetype application/pdf
• dc.identifier.citation Vazquez-Vilar G, Tauste A, Guillén A, Martinez A. Bayesian M-Ary hypothesis testing: the meta-converse and Verdú-Han bounds are tight. IEEE Trans Inf Theory. 2016;62(5):2324 - 33. DOI: 10.1109/TIT.2016.2542080
• dc.identifier.doi http://dx.doi.org/10.1109/TIT.2016.2542080
• dc.identifier.issn 0018-9448
• dc.identifier.uri http://hdl.handle.net/10230/36000
• dc.language.iso eng
• dc.publisher Institute of Electrical and Electronics Engineers (IEEE)
• dc.relation.ispartof IEEE Transactions on Information Theory. 2016;62(5):2324 - 33.
• dc.relation.projectID info:eu-repo/grantAgreement/EC/FP7/259663
• dc.relation.projectID info:eu-repo/grantAgreement/ES/1PE/FPI2013-18602
• dc.relation.projectID info:eu-repo/grantAgreement/ES/3PN/RYC2011-08150
• dc.relation.projectID info:eu-repo/grantAgreement/ES/3PN/TEC2012-38800-C03-03
• dc.relation.projectID info:eu-repo/grantAgreement/EC/FP7/303633
• dc.relation.projectID info:eu-repo/grantAgreement/EC/FP7/329837
• dc.rights © 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The final published article can be found at http://dx.doi.org/10.1109/TIT.2016.2542080
• dc.rights.accessRights info:eu-repo/semantics/openAccess
• dc.subject.keyword Error probability
• dc.subject.keyword Testing
• dc.subject.keyword Bayes methods
• dc.subject.keyword Random variables
• dc.subject.keyword Channel coding
• dc.subject.keyword Electronic mail
• dc.title Bayesian M-Ary hypothesis testing: the meta-converse and Verdú-Han bounds are tight
• dc.type info:eu-repo/semantics/article
• dc.type.version info:eu-repo/semantics/acceptedVersion