Bayesian M-Ary hypothesis testing: the meta-converse and Verdú-Han bounds are tight

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dc.contributor.authorVazquez-Vilar, Gonzalo
dc.contributor.authorTauste Campo, Adrià, 1982-
dc.contributor.authorGuillén i Fábregas, A. (Albert)
dc.contributor.authorMartínez, Alfonso, 1973-
dc.date.accessioned2018-12-05T14:31:31Z
dc.date.available2018-12-05T14:31:31Z
dc.date.issued2016
dc.description.abstractTwo alternative exact characterizations of the minimum error probability of Bayesian M-ary hypothesis testing are derived. The first expression corresponds to the error probability of an induced binary hypothesis test and implies the tightness of the meta-converse bound by Polyanskiy et al.; the second expression is a function of an information-spectrum measure and implies the tightness of a generalized Verdú-Han lower bound. The formulas characterize the minimum error probability of several problems in information theory and help to identify the steps where existing converse bounds are loose.en
dc.description.sponsorshipThis work was supported in part by the European Research Council under Grant 259663, in part by the Spanish Ministry of Economy and Competitiveness under Grant FPDI-2013-18602, Grant RYC-2011-08150, and Grant TEC2012-38800-C03-03, and in part by the European Union’s 7th Framework Programme under Grant 303633 and Grant 329837.
dc.format.mimetypeapplication/pdf
dc.identifier.citationVazquez-Vilar G, Tauste A, Guillén A, Martinez A. Bayesian M-Ary hypothesis testing: the meta-converse and Verdú-Han bounds are tight. IEEE Trans Inf Theory. 2016;62(5):2324 - 33. DOI: 10.1109/TIT.2016.2542080
dc.identifier.doihttp://dx.doi.org/10.1109/TIT.2016.2542080
dc.identifier.issn0018-9448
dc.identifier.urihttp://hdl.handle.net/10230/36000
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofIEEE Transactions on Information Theory. 2016;62(5):2324 - 33.
dc.relation.projectIDinfo:eu-repo/grantAgreement/EC/FP7/259663
dc.relation.projectIDinfo:eu-repo/grantAgreement/ES/1PE/FPI2013-18602
dc.relation.projectIDinfo:eu-repo/grantAgreement/ES/3PN/RYC2011-08150
dc.relation.projectIDinfo:eu-repo/grantAgreement/ES/3PN/TEC2012-38800-C03-03
dc.relation.projectIDinfo:eu-repo/grantAgreement/EC/FP7/303633
dc.relation.projectIDinfo:eu-repo/grantAgreement/EC/FP7/329837
dc.rights© 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The final published article can be found at http://dx.doi.org/10.1109/TIT.2016.2542080
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess
dc.subject.keywordError probability
dc.subject.keywordTesting
dc.subject.keywordBayes methods
dc.subject.keywordRandom variables
dc.subject.keywordChannel coding
dc.subject.keywordElectronic mail
dc.titleBayesian M-Ary hypothesis testing: the meta-converse and Verdú-Han bounds are tight
dc.typeinfo:eu-repo/semantics/article
dc.type.versioninfo:eu-repo/semantics/acceptedVersion

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