Modulation-enhanced localization microscopy
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- dc.contributor.author Reymond, Loïc
- dc.contributor.author Huser, Thomas
- dc.contributor.author Ruprecht, Verena
- dc.contributor.author Wieser, Stefan
- dc.date.accessioned 2020-11-23T07:04:45Z
- dc.date.available 2020-11-23T07:04:45Z
- dc.date.issued 2020
- dc.description.abstract Super-resolution fluorescence microscopy has become a powerful tool in cell biology to observe sub-cellular organization and molecular details below the diffraction limit of light. Super-resolution methods are generally classified into three main concepts: stimulated emission depletion (STED), single molecule localization microscopy (SMLM) and structured illumination microscopy (SIM). Here, we highlight the novel concept of modulation-enhanced localization microscopy (meLM) which we designate as the 4th super-resolution method. Recently, a series of modulation-enhanced localization microscopy methods have emerged, namely MINFLUX, SIMPLE, SIMFLUX, ModLoc and ROSE. Although meLM combines key ideas from STED, SIM and SMLM, the main concept of meLM relies on a different idea: isolated emitters are localized by measuring their modulated fluorescence intensities in a precisely shifted structured illumination pattern. To position meLM alongside state-of-the-art super-resolution methods we first highlight the basic principles of existing techniques and show which parts of these principles are utilized by the meLM method. We then present the overall novel super-resolution principle of meLM that can theoretically reach unlimited localization precision whenever illumination patterns are translated by an arbitrarily small distance.
- dc.description.sponsorship L R acknowledges support of a fellowship from 'la Caixa' Foundation (ID 100010434, LCF/BQ/IN18/11660032) and funding from the European Union´s Horizon 2020 research and innovation programme under the Marie Skłodowska-Curie grant agreement No 713673. V R acknowledges support from the Spanish Ministry of Economy and Competitiveness through the Program 'Centro de Excelencia Severo Ochoa 2013-2017', the CERCA Programme/Generalitat de Catalunya, MINECO's Plan Nacional (BFU2017-86296-P) and support from the CRG Advanced Light Microscopy Facility. S W acknowledges support from the Spanish Ministry of Economy and Competitiveness through the 'Severo Ochoa' program for Centres of Excellence in R&D (SEV-2015-0522), from Fundació Privada Cellex, and from Generalitat de Catalunya through the CERCA program.
- dc.format.mimetype application/pdf
- dc.identifier.citation Reymond L, Huser T, Ruprecht V, Wieser S. Modulation-enhanced localization microscopy. Journal of Physics: Photonics. 2020; 2(4):041001. DOI: 10.1088/2515-7647/ab9eac
- dc.identifier.doi http://dx.doi.org/10.1088/2515-7647/ab9eac
- dc.identifier.issn 2515-7647
- dc.identifier.uri http://hdl.handle.net/10230/45848
- dc.language.iso eng
- dc.publisher IOP Publishing Ltd.
- dc.relation.ispartof Journal of Physics: Photonics. 2020; 2(4):041001
- dc.relation.projectID info:eu-repo/grantAgreement/EC/H2020/713673
- dc.relation.projectID info:eu-repo/grantAgreement/ES/2PE/BFU2017-86296-P
- dc.rights © 2020 The Author(s). Published by IOP Publishing Ltd. Original content from this work may be used under the terms of the Creative Commons Attribution 4.0 license. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
- dc.rights.accessRights info:eu-repo/semantics/openAccess
- dc.rights.uri https://creativecommons.org/licenses/by/4.0/
- dc.title Modulation-enhanced localization microscopy
- dc.type info:eu-repo/semantics/article
- dc.type.version info:eu-repo/semantics/publishedVersion