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Bayesian M-Ary hypothesis testing: the meta-converse and Verdú-Han bounds are tight

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dc.contributor.author Vazquez-Vilar, Gonzalo
dc.contributor.author Tauste Campo, Adrià
dc.contributor.author Guillén i Fàbregas, Albert
dc.contributor.author Martinez, Alfonso
dc.date.accessioned 2018-12-05T14:31:31Z
dc.date.available 2018-12-05T14:31:31Z
dc.date.issued 2016
dc.identifier.citation Vazquez-Vilar G, Tauste A, Guillén A, Martinez A. Bayesian M-Ary hypothesis testing: the meta-converse and Verdú-Han bounds are tight. IEEE Trans Inf Theory. 2016;62(5):2324 - 33. DOI: 10.1109/TIT.2016.2542080
dc.identifier.issn 0018-9448
dc.identifier.uri http://hdl.handle.net/10230/36000
dc.description.abstract Two alternative exact characterizations of the minimum error probability of Bayesian M-ary hypothesis testing are derived. The first expression corresponds to the error probability of an induced binary hypothesis test and implies the tightness of the meta-converse bound by Polyanskiy et al.; the second expression is a function of an information-spectrum measure and implies the tightness of a generalized Verdú-Han lower bound. The formulas characterize the minimum error probability of several problems in information theory and help to identify the steps where existing converse bounds are loose.
dc.description.sponsorship This work was supported in part by the European Research Council under Grant 259663, in part by the Spanish Ministry of Economy and Competitiveness under Grant FPDI-2013-18602, Grant RYC-2011-08150, and Grant TEC2012-38800-C03-03, and in part by the European Union’s 7th Framework Programme under Grant 303633 and Grant 329837.
dc.format.mimetype application/pdf
dc.language.iso eng
dc.publisher Institute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartof IEEE Transactions on Information Theory. 2016;62(5):2324 - 33.
dc.rights © 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The final published article can be found at http://dx.doi.org/10.1109/TIT.2016.2542080
dc.title Bayesian M-Ary hypothesis testing: the meta-converse and Verdú-Han bounds are tight
dc.type info:eu-repo/semantics/article
dc.identifier.doi http://dx.doi.org/10.1109/TIT.2016.2542080
dc.subject.keyword Error probability
dc.subject.keyword Testing
dc.subject.keyword Bayes methods
dc.subject.keyword Random variables
dc.subject.keyword Channel coding
dc.subject.keyword Electronic mail
dc.relation.projectID info:eu-repo/grantAgreement/EC/FP7/259663
dc.relation.projectID info:eu-repo/grantAgreement/ES/1PE/FPI2013-18602
dc.relation.projectID info:eu-repo/grantAgreement/ES/3PN/RYC2011-08150
dc.relation.projectID info:eu-repo/grantAgreement/ES/3PN/TEC2012-38800-C03-03
dc.relation.projectID info:eu-repo/grantAgreement/EC/FP7/303633
dc.relation.projectID info:eu-repo/grantAgreement/EC/FP7/329837
dc.rights.accessRights info:eu-repo/semantics/openAccess
dc.type.version info:eu-repo/semantics/acceptedVersion


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